High-sensitivity photoluminescence measurement system

Complete, modular, fully operational system for steady state, fluorescence lifetime, phosphorescence lifetime, and PLQY measurements.

Photoluminescence (PL) is a common non-contact and non-destructive technique used to characterize the optoelectronic properties of semiconductors and other materials. Its operation principle relies on electrons that are excited from the valence to the conductance band of the material by a light source with an energy larger than the bandgap. As a consequence, the photoexcited carriers relax and then spontaneously recombine with holes in the conduction band. In the case of direct semiconductors, the excess energy is emitted in the form of light (spontaneous emission). By analyzing the spectrum of the emitted light, it is possible to measure the material's response in terms of intensity as a function of wavelength. This gives access to information regarding the band structure – the bandgap width, the relative light generation efficiency, the quality of the material (inhomogeneous broadening), etc. Optoelectronics and Measurement Techniques Unit, University of Oulu, is seeking a complete, modular, fully operational system for steady-state, fluorescence lifetime, phosphorescence lifetime, and PLQY measurements photoluminescence system that will complement the rich portfolio of optical measurement devices available in the unit. The PL device is designated for the research and development of various materials, nano- and micro-structures and operational devices.