Dielectric properties measurement probe kit

Tampere University Foundation sr (Contracting authority) is publishing direct award notice for 'Dielectric properties measurement probe kit'.

BACKGROUND INFO To advance research and teaching in bioelectromagnetics and high frequency electronics, Tampere University (“TAU”) is seeking to expand the measurement capabilities of its RF laboratory TD408. A High-precision dielectric properties measurement probe kit would enable the characterization of materials used in antennas, medical devices, flexible circuits, and wearable wireless devices. The probe would be used with the existing vector network analyzers of Tampere Electronic Research Center of TAU. The new measurement facility will support research and education by providing students and researchers with practical access to dielectric characterization. NEED This procurement focuses on the purchase of High-precision dielectric properties measurement probe kits for indoor use in the RF measurement lab of TAU. The system will be used for nondestructive characterization of thin polymeric layers (~0.1 mm), flexible textiles and laminates, biological phantoms (solid, semi-solid, and liquid), and wearable-electronics’ materials (polymer-based conductors and substrates). Technical specifications are: • The system shall determine complex relative permittivity, including dielectric constant (ε′), dielectric loss factor (ε″), loss tangent (tan δ) and electrical conductivity, from vector network analyzer reflection measurements. • covers the frequency range from 4 MHz to 67 GHz without frequency gaps by means of interchangeable probe units. The probe configuration shall include measurement ranges of at least 4MHz—67 GHz. • The probe should be able to measure solid and semi-solid sheet samples with finite thicknesses from 0.1 to 10 mm. • Dielectric probes often consider the sample size infinite, which lead to errors in measurements. The probe should determine the dielectric properties using the actual dimensions of the sample and should not treat the sample as electromagnetically infinite in the thickness direction. • Unlike the conventional probes, the system shall be able to measure the permittivity of soft, compressible, polymeric materials without compressing or changing their thicknesses. This needs an integrated force sensor for measuring, controlling and recording the force applied between the probe and the sample. The required dynamic range of force is approximately 0 –100 N. • The system shall be fully compatible with Tampere University’s existing Keysight P5004B vector network analyzer for measurements up to 20 GHz and Keysight N5227B PNA for measurements up to 67 GHz. All necessary control interfaces, cables, connectors, softwares and adapters shall be included. • The system shall compensate for microscopic air gaps between the probe and sample and for flange-resonance effects in the dielectric-parameter calculation. It shall include automatic probe alignment and repeatable positioning to support measurements of non-smooth solid surfaces. • Conventional probes have major disadvantages of measurement uncertainties occurred due to the air gap between the sample and probe (they need firm contact). Moreover, they are unable to measure the dielectric properties of non-smooth solid surfaces. This new system should include automatic probe alignment and repeatable positioning for calibration to precisely measure the dielectric properties of non-smooth surfaces. • The probe should be able to measure the dielectric properties of small volumes (10–50 mL) of liquids, gels and samples of biological phantoms such as minced meat, depending on the selected probe and frequency range. • Measurement repeatability shall typically be within ±1% under the supplier’s specified reference conditions. • The measured sample thickness and probe-contact conditions shall be automatically incorporated into the dielectric-parameter calculation and recorded with the measurement results with the automated mechanism of self-adjustment. • Sample thickness shall be measured automatically and in-situ by the measurement system. Thickness-measurement precision shall be 3 µm or better. Manual entry of a separately measured nominal thickness alone is not sufficient. CONCLUSION FOR DIRECT AWARD Meeting all the specified requirements and providing the required measurement capabilities as one integrated system are mandatory for selection in this procurement process. The SPEAG DAK TL2 dielectric material measurement system is to be procured from the selected supplier, together with the DAK 12 TL2, DAK 3.5 TL2 and DAK 1.2E TL2 probes and the equipment and software needed for operation. The main requirements are dielectric characterization from 4 MHz to 67 GHz using Tampere University’s existing network analyzers, nondestructive measurement of solid and semi-solid layers between 0.1 and 10 mm thick, automated thickness measurement, and controlled and recorded probe-contact force. The system must account for sample thickness, microscopic air gaps and flange-resonance effects in the permittivity calculation. It must also allow different probes to be used on the same platform and permit later expansion. Other broadband probe systems were identified within market analysis. Although these systems cover substantial parts of the required frequency range, they do not provide the required thin-layer (~0.1 mm) measurement and correction capabilities together on one automated platform. The SPEAG DAK TL2 is the only identified commercially available system that meets all the requirements as an integrated solution. Due to these technical requirements, no reasonable equivalent substitute has been identified. The absence of competition is not due to an artificial narrowing of the procurement conditions. The requirements arise from the intended research samples, the required measurement quality and frequency range, and the need to use equipment already owned by Tampere University.