X-ray Diffraction (XRD) measurement system for residual stresses

Tampere University Foundation sr is inviting tenders, procurement is 'X-ray Diffraction (XRD) measurement system for residual stresses', hereinafter 'XRD RS'.

Tampere University (TAU) will purchase a new X-ray diffraction (XRD) based residual stress device which is also applicable to measure retained austenite. The purpose of this procurement is to enable state-of-the-art residual stress analysis with fast measurements. The device should work in laboratory and field conditions (on-site measurements). The comprehensive offer should include the following: X-ray diffractometer for measuring residual stresses and retained austenite, transport cases for the device, training, software for measuring and evaluating results, manuals, warranty certifications, specifications regarding the computer performance for the device as well as supply specifications for device such as water, compressed air, cooling, gas, ventilation, air quality requirements, or lubricants and coolants must be stated in the tender. * * * * Pls pay extra attention to 2 of call's attachments: - Information of existing infrastructure for X-ray diffraction. - Instructions and expectations for the online demo (to be arranged in phase II by tenderer). * * * * PRICING Contracting authority's expectation for pricing: max 180 000 € (excl. VAT), covering all mandatory requirements.